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A nonvolatile memory cell and non-volatile memory cells and university as well as processes for their preparation

机译:非易失性存储单元,非易失性存储单元,大学及其制备方法

摘要

A nonvolatile memory has: (a) second conductivity type common source, programming/read drain and monitor drain connections (32, 33, 34) spaced apart below a first conductivity type semiconductor substrate (42) surface; (b) a tunnelling insulation layer (40) on the substrate (42) between the common source and programming/read drain connections (32, 33); (c) an insulating layer (41) on the substrate (42) between the common source and monitor drain connections (32, 34); (d) a floating gate (31) on the tunnelling insulation and insulating layers (40, 41); and (e) a control gate (30) on a dielectric layer (44) above the floating gate (31). Also claimed is a process for producing the above nonvolatile memory. The nonvolatile memory has: (a') spaced-apart alternate first and second impurity regions (32, 33) below the surface of a first conductivity type semiconductor substrate (42); (b') several insular tunnelling insulation layers (40) on the substrate (42), each located between a second and a first impurity region at one side of the middle of the first impurity region; (c') an insulating layer (41) on the substrate (42) but not on the tunnelling insulation layers (40); (d') several floating gates (31), each lying on one of the tunnelling insulation layers (40) and on the insulating layer (41) portion located on the other side of the middle of the first impurity region between another second impurity region and the first impurity region; and (e') several word lines (30) on the floating gates (31) at right angles to the first and second impurity regions (32, 33).
机译:非易失性存储器具有:(a)第二导电类型的公共源极,编程/读取漏极和监视器漏极连接(32、33、34),其在第一导电类型的半导体衬底(42)表面下方间隔开; (b)在基板(42)上的公共源极和编程/读取漏极连接(32、33)之间的隧穿绝缘层(40); (c)在基板(42)上的公共源极和监视器漏极连接(32、34)之间的绝缘层(41); (d)在隧道绝缘层和绝缘层(40、41)上的浮栅(31); (e)在浮置栅极(31)上方的介电层(44)上的控制栅极(30)。还要求保护一种用于制造上述非易失性存储器的方法。非易失性存储器具有:(a’)在第一导电型半导体衬底(42)的表面的下方隔开间隔的交替的第一杂质区域(32)和第二杂质区域(33)。 (b′)在衬底(42)上的几个岛状隧穿绝缘层(40),每个位于第一杂质区的中间一侧的第二杂质区和第一杂质区之间; (c’)在衬底(42)上的绝缘层(41),而不在隧道绝缘层(40)上; (d′)几个浮置栅极(31),每个浮置栅极(31)位于隧穿绝缘层(40)中的一个上并且位于位于另一第二杂质区之间的第一杂质区的中间的另一侧的绝缘层(41)上第一杂质区; (e’)与第一和第二杂质区(32、33)成直角的在浮栅(31)上的几条字线(30)。

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