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Arrangement for simultaneous force microscopy during optical near field microscopy has coupling element consisting at least partly of set material and can additionally contain bearer parts
Arrangement for simultaneous force microscopy during optical near field microscopy has coupling element consisting at least partly of set material and can additionally contain bearer parts
The arrangement has a probe (1) and a coupling element connected to it for coupling light in or out. The coupling element consists at least in part of a set material and can additionally contain parts of a bearer joined to the probe using setting material. An Independent claim is also included for a method of manufacturing an arrangement for simultaneous force microscopy during optical near field microscopy.
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