首页> 外国专利> Imagewise thermoresists exposure for manufacture of integrated circuits, involves performing two dimensional scanning of image of light valve across surface of resist with optical system set at different focus settings

Imagewise thermoresists exposure for manufacture of integrated circuits, involves performing two dimensional scanning of image of light valve across surface of resist with optical system set at different focus settings

机译:以成像方式进行热抗蚀剂曝光以制造集成电路,涉及在光学系统设置为不同焦点设置的情况下对抗蚀剂表面上的光阀图像进行二维扫描

摘要

Method for imagewise exposing resists involves illuminating a light valve (11) using a laser to form image of light valve on substrate which is covered with thin layer of thermoresist (9). The image of light valve is scanned two or more times by 2D scanning across the surface of resist with the optical system set at different focus settings.
机译:使抗蚀剂成像地曝光的方法包括使用激光照射光阀(11)以在覆盖有热敏电阻(9)薄层的基板上形成光阀的图像。通过将光学系统设置在不同的焦点设置下,在抗蚀剂表面上进行2D扫描,可以对光阀的图像进行两次或两次以上的扫描。

著录项

  • 公开/公告号DE19954365A1

    专利类型

  • 公开/公告日2001-05-17

    原文格式PDF

  • 申请/专利权人 CREO SRL BURNABY;

    申请/专利号DE1999154365

  • 发明设计人 GELBART DANIEL;

    申请日1999-11-11

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:11

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