首页> 外国专利> Method for removing solid residual matter on surfaces of semiconductor layers occurring during wet etching involves chemical dipping, a first quick rinse with DI water, turning layers at a preset angle and a second quick rinse.

Method for removing solid residual matter on surfaces of semiconductor layers occurring during wet etching involves chemical dipping, a first quick rinse with DI water, turning layers at a preset angle and a second quick rinse.

机译:去除在湿法刻蚀过程中出现的半导体层表面上的固体残留物的方法包括化学浸渍,第一次用去离子水快速冲洗,以预定角度翻转层以及第二次快速冲洗。

摘要

Side areas of layers (30) are turned away from a whirling area behind the connecting area of a layer retainer (31) and a mount (41). The process involves chemical dipping, a first quick rinse with DI water, turning the layers at a preset angle and a second quick rinse with DI water followed by washing off and drying.
机译:层(30)的侧区域从层保持器(31)和底座(41)的连接区域后面的旋转区域转向。该过程包括化学浸渍,第一次用去离子水快速漂洗,以预定角度旋转各层,第二次用去离子水快速漂洗,然后洗净并干燥。

著录项

  • 公开/公告号DE19960573A1

    专利类型

  • 公开/公告日2001-06-28

    原文格式PDF

  • 申请/专利号DE1999160573

  • 发明设计人

    申请日1999-12-15

  • 分类号H01L21/306;H01L21/68;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:06

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