Calibration device for optical strip projection measuring system, has surface which has coarseness with middle depth of roughness that is large in relation to wavelength of electromagnetic radiation

摘要

A surface (40), assigned to an optical measuring system, can be loaded with an electromagnetic radiation. The surface is optically impervious and has a coarseness with a middle depth of roughness that is large in relation to a wavelength of electromagnetic radiation. An Independent claim is included for a calibration device manufacturing method.