首页> 外国专利> Regular structural feature detection, involves determining at least one mathematical function based on degree of brightness or color tone on substrate surface, and then determining amplitude spectrum

Regular structural feature detection, involves determining at least one mathematical function based on degree of brightness or color tone on substrate surface, and then determining amplitude spectrum

机译:常规的结构特征检测包括根据基材表面的亮度或色调程度确定至少一个数学函数,然后确定振幅谱

摘要

The optical cover of a surface area (6) on the substrate surface (5) is detected optically. At least one mathematical function is determined based on the degree of brightness or color tone alternating regularly on the substrate surface. The amplitude spectrum of the mathematical function is then determined. An Independent claim is also included for a regular structural feature detecting device.
机译:光学检测基板表面(5)上的表面区域(6)的光学覆盖。基于在基板表面上规则地交替的亮度或色调的程度,确定至少一个数学函数。然后确定数学函数的振幅谱。独立权利要求还包括常规结构特征检测设备。

著录项

  • 公开/公告号DE10006782A1

    专利类型

  • 公开/公告日2001-08-23

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号DE2000106782

  • 发明设计人 DEININGER CHRISTINE;

    申请日2000-02-18

  • 分类号G01B21/30;G01N21/88;H01L21/66;H01L21/60;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:57

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