首页> 外国专利> Procedure for optical measurement of the shape of reflecting outer surfaces by use of single value, wavelength or intensity, light sources so that a single valued image pattern is obtained

Procedure for optical measurement of the shape of reflecting outer surfaces by use of single value, wavelength or intensity, light sources so that a single valued image pattern is obtained

机译:通过使用单一值,波长或强度,光源对反射外表面的形状进行光学测量的程序,以便获得单一值的图像图案

摘要

Procedure in which the space above the object is illuminated with light the intensity and or wavelength of which is coded with respect to the origination direction of the light beam. The coding is single valued so that light of a certain intensity or wavelength originates only from one point. A camera is then used to record the reflected image from the outer surface of the reflective object. The camera image is a three dimensional coding of the space above the object.
机译:在此过程中,用相对于光束出射方向进行编码的强度和/或波长的光照射对象上方的空间。编码是单值的,因此特定强度或波长的光仅来自一个点。然后使用照相机来记录从反射物体的外表面反射的图像。摄像机图像是对象上方空间的三维编码。

著录项

  • 公开/公告号DE10014964A1

    专利类型

  • 公开/公告日2001-01-18

    原文格式PDF

  • 申请/专利权人 SESNER RAINER;

    申请/专利号DE2000114964

  • 发明设计人 SESNER RAINER;

    申请日2000-03-25

  • 分类号G01B11/24;G01B11/30;G01N21/95;G01M11/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:53

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