首页> 外国专利> Lateral mode suppression in semiconductor bulk acoustic resonator (SBAR) devices using tapered electrodes, and electrodes edge damping materials

Lateral mode suppression in semiconductor bulk acoustic resonator (SBAR) devices using tapered electrodes, and electrodes edge damping materials

机译:使用锥形电极和电极边缘阻尼材料的半导体体声谐振器(SBAR)器件中的横向模式抑制

摘要

A semiconductor bulk acoustic resonator (SBAR) with improved passband insertion loss and phase performance characteristics is suitable for use in a wide variety of narrowband filtering applications. The SBAR is configured to suppress lateral propagating acoustical wave modes. The lateral acoustical wave modes are controlled by varying the lateral dimension of the resonator electrodes and or utilizing a viscous acoustic damping material, such as a viscoelastic material, such as polyimide, applied along at least a portion of the perimeter of the electrodes to attenuate reflections of the lateral acoustic modes at the electrode edges back into the electrode region.
机译:具有改善的通带插入损耗和相位性能特性的半导体体声谐振器(SBAR)适用于各种窄带滤波应用。 SBAR被配置为抑制横向传播的声波模式。通过改变谐振器电极的横向尺寸和/或利用沿着电极的至少一部分周边施加的粘性声阻尼材料,例如粘弹性材料,例如聚酰亚胺,来控制横向声波模式,以衰减反射。在电极边缘的横向声模的变化回到电极区域。

著录项

  • 公开/公告号US6150703A

    专利类型

  • 公开/公告日2000-11-21

    原文格式PDF

  • 申请/专利权人 TRW INC.;

    申请/专利号US19980106729

  • 发明设计人 DREW CUSHMAN;JAY D. CRAWFORD;

    申请日1998-06-29

  • 分类号H01L29/82;

  • 国家 US

  • 入库时间 2022-08-22 01:06:31

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