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High accuracy, high speed, low power analog-to-digital conversion method and circuit

机译:高精度,高速,低功耗模数转换方法及电路

摘要

A high accuracy, high speed, low power analog-to-digital conversion method and circuit. An input signal is sampled and the sample is compared to a scan signal whose amplitude varies with time. A time-to-digital conversion of the sample is obtained. At least two reference signals are also provided which are compared to the scan signal. Time-to-digital conversions of the reference signals are also obtained. The digital value of the sample is determined with reference to the known mathematical description of the scan signal, the time-to-digital conversions and the reference signals. The method and circuit may be employed in stages, where in a first stage, the most significant bits are determined and in a second stage, the least significant bits are determined.
机译:一种高精度,高速,低功耗的模数转换方法和电路。对输入信号进行采样,并将采样与幅度随时间变化的扫描信号进行比较。获得了样品的时间数字转换。还提供了至少两个参考信号,它们与扫描信号进行比较。还可以获得参考信号的时间数字转换。参考扫描信号的已知数学描述,时间数字转换和参考信号来确定样本的数字值。可以分阶段采用该方法和电路,其中在第一阶段中,确定最高有效位,在第二阶段中,确定最低有效位。

著录项

  • 公开/公告号US6177901B1

    专利类型

  • 公开/公告日2001-01-23

    原文格式PDF

  • 申请/专利权人 PAN LI;PAN YI;

    申请/专利号US19990243897

  • 发明设计人 LI PAN;YI PAN;

    申请日1999-02-03

  • 分类号H03M15/00;

  • 国家 US

  • 入库时间 2022-08-22 01:05:32

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