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Method of etching thermally grown oxide substantially selectively relative to deposited oxide

机译:相对于沉积氧化物基本上选择性地蚀刻热生长氧化物的方法

摘要

The invention comprises processing deposited oxide and grown oxide materials. In one implementation, a substrate is provided to have outwardly exposed grown oxide material and having deposited oxide material. The grown oxide material is etched substantially selective relative to the deposited oxide material. In another considered aspect, a silicon surface is thermally oxidized to form substantially undoped silicon dioxide over a substrate. A substantially undoped silicon dioxide layer is chemical vapor deposited over the substrate, with at least some of the thermally grown silicon dioxide being outwardly exposed. The exposed thermally grown silicon dioxide layer is vapor etched substantially selective relative to the deposited silicon dioxide layer using an etch chemistry comprising substantially anhydrous HF and an organic primer.
机译:本发明包括处理沉积的氧化物和生长的氧化物材料。在一个实施方式中,提供一种基底,该基底具有向外暴露的生长的氧化物材料和沉积的氧化物材料。相对于沉积的氧化物材料,基本上选择性地蚀刻生长的氧化物材料。在另一个考虑的方面,硅表面被热氧化以在衬底上形成基本上未掺杂的二氧化硅。基本上未掺杂的二氧化硅层是化学气相沉积在基板上,并且至少一些热生长的二氧化硅向外暴露。使用包括基本上无水的HF和有机底漆的蚀刻化学物质,相对于沉积的二氧化硅层,对暴露的热生长的二氧化硅层进行气相选择性蚀刻。

著录项

  • 公开/公告号US6194286B1

    专利类型

  • 公开/公告日2001-02-27

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US20000483746

  • 发明设计人 KEVIN J. TOREK;

    申请日2000-01-17

  • 分类号H01L217/60;

  • 国家 US

  • 入库时间 2022-08-22 01:04:59

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