Device for measuring the rise time of signals interfered with by noise from gamma or X radiation detectors

摘要

The invention relates to a device for measuring the rise time of the electronic component of a signal disturbed by electronic noise and whose signal-to-noise ratio is mediocre. It incorporates a differentiating circuit (C12, C11) having at least one resistor (r) and one capacitor (c) implementing a high pass filter for filtering the low frequency background noise of the signal from the detector and a discriminating circuit (C21, C22) incorporating a comparator (k) for performing a comparison with the filtered signal from the differentiating circuit and an offset voltage selected as a function of the noise level interfering with the signal from the detector.