首页> 外国专利> Patch-flatness test unit for high order rational surface patch rendering systems

Patch-flatness test unit for high order rational surface patch rendering systems

机译:用于高阶有理曲面补丁渲染系统的补丁平坦度测试单元

摘要

A high order surface patch rendering system with adaptive tessellation. A patch is rendered by subdividing a patch until the subpatches are sufficiently flat that they can be approximated by a quadrilateral. To determine when a subpatch is flat enough to be approximated with a quadrilateral, the patch rendering system uses a patch flatness test unit which tests the straightness of the edges and internal curves of the subpatch. The edges and internal curves of a subpatch are determined to be straight if the intermediate control points of a curve are within a tolerance range of a straight line between the curve's endpoints. The tolerance range is chosen with respect to a pixel resolution of the final image so that subpatch is determined to be flat when the curvature of the subpatch cannot be perceived relative to a flat surface. One embodiment contemplates a flatness test unit for determining the flatness of a patch having a set of control points. The flatness test unit comprises a series of stages. The first stage is configured to receive and store the set of control points. The second stage is coupled to the first stage to receive pairs of control points and configured to determine control point coordinate differences. The third stage is coupled to the second stage to receive the control point coordinate differences and configured to determine absolute values of the control point differences. The fourth stage is coupled to the third stage to receive absolute values of the control point coordinate differences along with the control point differences and configured to determine multiplicand pairs. The fifth stage is coupled to the fourth stage to receive and multiply multiplicand pairs to determine products. The sixth stage is coupled to the fifth stage to receive products and configured to determine control point deviations and deviation tolerances. The seventh stage is coupled to the sixth stage to receive the control point deviations and deviation tolerances and configured to determine a deviation flag to indicate if the control point deviations are less than the deviation tolerances. The eighth stage is coupled to the seventh stage to receive the deviation flag and determine edge straightness and patch flatness flags.
机译:具有自适应细分的高阶曲面补丁渲染系统。通过细分补丁直到子补丁足够平坦以至可以用四边形近似来渲染补丁。为了确定子补丁何时足够平坦以近似四边形,补丁渲染系统使用补丁平坦度测试单元来测试子补丁的边缘和内部曲线的平直度。如果曲线的中间控制点在曲线端点之间的直线的公差范围内,则确定子补丁的边缘和内部曲线为直线。相对于最终图像的像素分辨率来选择公差范围,以使得当子补丁的曲率相对于平坦表面时,子补丁被确定为平坦的。一个实施例设想一种平坦度测试单元,用于确定具有一组控制点的贴剂的平坦度。平坦度测试单元包括一系列阶段。第一级配置为接收和存储控制点集。第二阶段耦合到第一阶段以接收成对的控制点,并且被配置为确定控制点坐标差。第三级耦合到第二级以接收控制点坐标差并且被配置为确定控制点差的绝对值。第四阶段耦合到第三阶段以接收控制点坐标差的绝对值以及控制点差,并且被配置为确定被乘数对。第五阶段耦合到第四阶段,以接收和乘以被乘数对以确定乘积。第六阶段耦合到第五阶段以接收产品并且被配置为确定控制点偏差和偏差公差。第七级耦合到第六级,以接收控制点偏差和偏差公差,并且配置成确定偏差标记以指示控制点偏差是否小于偏差公差。第八阶段耦合到第七阶段,以接收偏差标志并确定边缘平直度和补丁平坦度标志。

著录项

  • 公开/公告号US6211883B1

    专利类型

  • 公开/公告日2001-04-03

    原文格式PDF

  • 申请/专利权人 LSI LOGIC CORPORATION;

    申请/专利号US19970921918

  • 发明设计人 VINEET GOEL;

    申请日1997-08-27

  • 分类号G06T12/00;

  • 国家 US

  • 入库时间 2022-08-22 01:04:44

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号