首页> 外国专利> Method for forming nanometer-sized silicon quantum dots

Method for forming nanometer-sized silicon quantum dots

机译:形成纳米级硅量子点的方法

摘要

The present invention is related to a method for forming nanometer-sized silicon quantum dots. The method includes the steps of: forming a silicon nitride thin film using active and low energy nitrogen ions on a silicon substrate; forming a uniform silicon thin film on the silicon nitride thin film by a silicon vapor deposition technique; forming silicon nitride islands by injecting a nitrogen gas; forming silicon quantum dots covered with the silicon nitride islands by etching silicon thin film, not covered with the silicon nitride thin film, by injecting an oxygen gas; eliminating the silicon nitride thin film covering the silicon quantum dots by using reactive ions.
机译:本发明涉及形成纳米级硅量子点的方法。该方法包括以下步骤:使用活性和低能氮离子在硅衬底上形成氮化硅薄膜;通过硅气相沉积技术在氮化硅薄膜上形成均匀的硅薄膜;通过注入氮气形成氮化硅岛;通过注入氧气来蚀刻未被氮化硅薄膜覆盖的硅薄膜,从而形成被氮化硅岛覆盖的硅量子点;通过使用反应离子消除覆盖硅量子点的氮化硅薄膜。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号