首页> 外国专利> Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection method

Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection method

机译:透明基板安装平台,透明基板刮伤检查装置,透明基板倾斜检查方法和装置以及透明基板检查方法

摘要

When mounting crystal blanks, crystal blanks can be mounted readily in a desired position on a mounting platform, and during pick-up, they can be readily detached from the mounting platform.;To inspect scratches in a crystal blank 1, diffused oblique light is shined onto the crystal blank 1 from below by light-emitting diodes 6, and light reflected by scratches on the crystal blank 1 is detected by image capturing means 11 directly above the crystal blank 1. The crystal blank 1 is conveyed to the mounting platform 2 by a conveyor robot arm 15, and after inspection, it is conveyed away by same. A plurality of grooves are formed in the mounting surface 3 of the mounting platform 2. Thereby, during mounting, the crystal blank 1 does not slide over the mounting platform 2 and after mounting, it does not adhere tightly to the mounting platform 2.
机译:当安装水晶毛坯时,可以轻松地将水晶毛坯安装在安装平台上的所需位置,并且在拾取过程中,可以轻松地将它们从安装平台上卸下。 / B>漫射的倾斜光通过发光二极管 6 从下方照射到晶体坯 1 上,并且由划痕反射的光反射在晶体坯 1 < / B>由图像捕获装置 11 检测到直接位于晶体坯 1上方。 晶体坯 1 通过传送机械手 15传送到安装平台 2 ,并在检查后被传送一样。在安装平台 2的安装表面 3 中形成有多个凹槽。 因此,在安装过程中,晶体坯 1 不会在安装平台 2 上滑动,并且在安装后,它不会紧紧粘附到安装平台 2。

著录项

  • 公开/公告号US6256091B1

    专利类型

  • 公开/公告日2001-07-03

    原文格式PDF

  • 申请/专利权人 NIPPON MAXIS CO. LTD.;

    申请/专利号US19980134359

  • 发明设计人 RYO KOBAYASHI;

    申请日1998-08-14

  • 分类号G01N210/00;

  • 国家 US

  • 入库时间 2022-08-22 01:03:57

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