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Observability register architecture for efficient production test and debug
Observability register architecture for efficient production test and debug
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机译:可观察性寄存器架构,可进行有效的生产测试和调试
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摘要
An observability register used in the testing of integrated circuits includes a configurable data path for allowing data to pass directly from the input port to the output port. Such a configuration is referred to as a bypass mode. The invention allows selected ones of a serial chain of observability registers to be configured in the bypass mode such that data from the remaining observability registers can more easily be analyzed.
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