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Method and system for automatically determining transparency behavior of non-scan cells for combinational automatic test pattern generation
Method and system for automatically determining transparency behavior of non-scan cells for combinational automatic test pattern generation
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机译:自动确定用于组合自动测试图案生成的非扫描单元的透明性的方法和系统
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摘要
A method and system for generating test vectors for testing scan-based sequential circuits that contain non-scan cells using combinational ATPG techniques. The present invention includes the computer implemented step of receiving a netlist description of an integrated circuit device that comprises scan cells and non-scannable cells. Under certain conditions, some non-scan cells may exhibit sequential transparency behavior. The present invention identifies such conditions and characterizes each non-scan cell as sequentially transparent or non-transparent. Based on such characterization, the present invention transforms non-scan cells exhibiting sequential transparency behavior with transparent logic models during combinational ATPG (Automatic Test Pattern Generation) analysis. Because non-scan cells of exhibiting sequential transparency behavior are not replaced with “force-to-X” models, the fault coverage of the test patterns thus generated is significantly improved.
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