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Stage control method and stage and exposure apparatus using the stage control method

机译:载物台控制方法以及使用该载物台控制方法的载物台和曝光装置

摘要

A high precision scanning positioning system with magnification and orthogonality correction, a scanning stage device, such as a micro lithography system, is attached to a fine grained stage and plate microtrellis mounted on a coarse motion stage at constant velocity during exposure Have a shelf. An increase or decrease in magnification can be achieved by moving one fine movement stage to the other fine stage at the same time as the scanning or the opposite direction during exposure of the plate. Similarly, by changing one fine motion stage to the other microtremor in the direction of the scan during exposure, it is possible to achieve orthogonality change and also rotate one fine stage to the other stage Thus, any correction of the rotation error can be achieved. By controlling the movement of the microtremor stage to other microtremor stages, the positioning control system corrects the synchronization error between the fine motion stages while changing the magnification and orthogonalityThe settling time can be reduced simultaneously.
机译:具有放大倍率和正交校正的高精度扫描定位系统,将扫描台设备(例如微光刻系统)安装在细颗粒台上,并且在曝光期间以恒定速度将板式微格以恒定速度安装在粗糙运动台上。通过在板的曝光期间在扫描的同时或相反的方向上将一个精细移动台移动到另一精细台,可以实现放大率的增大或减小。类似地,通过在曝光期间在扫描方向上将一个精细运动平台改变为另一微颤动,可以实现正交性变化,并且还可以将一个精细平台移动到另一平台,因此,可以实现旋转误差的任何校正。通过控制微震台向其他微震台的移动,定位控制系统可以在改变放大倍率和正交性的同时校正微动台之间的同步误差。可以同时减少稳定时间。

著录项

  • 公开/公告号JPWO99/40487A1

    专利类型

  • 公开/公告日2002-10-08

    原文格式PDF

  • 申请/专利权人 株式会社ニコン;

    申请/专利号JP特願2000-530837(P2000-530837)

  • 发明设计人 ユアン バウサン;佐伯 和明;

    申请日1999-02-05

  • 分类号G03F7/22;G03F9/00;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 01:02:53

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