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Device for distance measurement using semiconductor laser in the visible wavelength region by propagation time method

机译:通过传播时间法在可见光波长范围内使用半导体激光器进行距离测量的装置

摘要

A device for distance measurement using a semiconductor laser in the visible wavelength range, which functions according to the echo time method, includes a collimation objective for bundling the transmitted measuring beam bundle, a circuit arrangement for modulating the measuring beam, a receiving objective for receiving and imaging the measuring beam bundle reflected at the distant object onto a receiving device, and an evaluation device for determining and displaying the distance measured to the object. The circuit arrangement for modulating the measuring beam and the evaluation device can be switched between two different operating modes. In the first operating mode, the modulation takes place using a first frequency and in the second operating mode using a second frequency. These frequencies stand in a whole-member ratio to each other. The reflected signal in the first operating mode is multiplied using a third frequency and in the second operating mode using a fourth frequency, before they are sampled for evaluation, in the first operating mode using a first sampling frequency and in the second operating mode using a second sampling frequency. In this context, the first sampling frequency is the difference between the fourth and the second frequency, and the second sampling frequency is a whole-number fraction of the second frequency.
机译:一种根据回波时间方法工作的,使用可见光波长范围内的半导体激光器进行距离测量的设备,包括用于捆绑发射的测量光束的准直物镜,用于调制测量光束的电路装置,用于接收的接收物镜。将在远处物体上反射的测量光束束成像到接收装置上,以及评估装置,用于确定并显示到物体的测量距离。可以在两种不同的运行模式之间切换用于调制测量光束的电路装置和评估装置。在第一工作模式中,使用第一频率进行调制,而在第二工作模式中,使用第二频率进行调制。这些频率彼此成整体比例。在对第一工作模式中的反射信号进行采样之前,使用第三频率对其进行倍频,而在第二工作模式中使用第四频率对其进行倍频评估,在第一工作模式中使用第一采样频率将其反射,将第二信号使用第二采样频率。在这种情况下,第一采样频率是第四频率与第二频率之差,第二采样频率是第二频率的整数分数。

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