首页>
外国专利>
Reflection measurement system for locking the removal of the system noise and to compensate for specimen holder topography
Reflection measurement system for locking the removal of the system noise and to compensate for specimen holder topography
展开▼
机译:反射测量系统,用于锁定系统噪声的消除并补偿样品架的形貌
展开▼
页面导航
摘要
著录项
相似文献
摘要
(57) [Abstract] Autonomous system uses a light reflectance to obtain information about the sample to inspect the intensity of the colored spot of the device membrane surrounded by the background area, to produce a spot. Alternately, a master clock (270) drives the LED of the two drives one LED was focused to a spot centered on (280), and was focused on the background area next.
展开▼