首页> 外国专利> Reflection measurement system for locking the removal of the system noise and to compensate for specimen holder topography

Reflection measurement system for locking the removal of the system noise and to compensate for specimen holder topography

机译:反射测量系统,用于锁定系统噪声的消除并补偿样品架的形貌

摘要

(57) [Abstract] Autonomous system uses a light reflectance to obtain information about the sample to inspect the intensity of the colored spot of the device membrane surrounded by the background area, to produce a spot. Alternately, a master clock (270) drives the LED of the two drives one LED was focused to a spot centered on (280), and was focused on the background area next.
机译:(57)[摘要]自治系统使用光反射率获取有关样本的信息,以检查被背景区域包围的设备膜着色斑点的强度,从而产生斑点。可替代地,主时钟(270)驱动两个驱动器中的LED,一个LED聚焦到以(280)为中心的点,然后聚焦在背景区域上。

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