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THREE-DIMENSIONAL SHAPE MEASURING DEVICE BY PHASE SHIFT METHOD

机译:相移法三维形状测量装置

摘要

PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring device capable of measuring the three-dimensional shape of an object surface having a large area highly accurately at high speed by using a phase shift method.;SOLUTION: Line illumination 4 having a sine wave-shaped intensity distribution is projected in the axial direction of an inspection object 3 by using an illumination unit 2. The place where the sine wave-shaped line illumination 4 is projected on the inspection object 3 is imaged by using a line sensor camera 1 having pixels arranged in the axial direction of the inspection object 3. The whole surface of the inspection object 3 is imaged by rotating the inspection object 3 by an inspection object driving motor 5, and the three-dimensional shape of the inspection object 3 is measured by the phase shift method.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种三维形状测量装置,该三维形状测量装置能够通过使用相移方法来高精度地高速测量具有大面积的物体表面的三维形状。通过使用照明单元2在检查对象3的轴向上投影正弦波形强度分布。通过使用线传感器照相机对在检查对象3上投影正弦波形线照明4的位置进行成像。如图1所示,在检查对象3的轴向上排列有像素。检查对象3的整个表面通过由检查对象驱动电动机5使检查对象3旋转来成像。检查对象3的三维形状为COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002257528A

    专利类型

  • 公开/公告日2002-09-11

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20010059053

  • 发明设计人 KAMATA TERUMI;SAKIDA RYUJI;

    申请日2001-03-02

  • 分类号G01B11/25;G01B11/24;G06T1/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:01:47

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