首页> 外国专利> DIFFRACTION GRATING REFLECTED WAVELENGTH MEASURING METHOD AND DEVICE, AND PHYSICAL QUANTITY MEASURING METHOD AND DEVICE

DIFFRACTION GRATING REFLECTED WAVELENGTH MEASURING METHOD AND DEVICE, AND PHYSICAL QUANTITY MEASURING METHOD AND DEVICE

机译:衍射光栅反射波长测量方法和装置,以及物理量测量方法和装置

摘要

PROBLEM TO BE SOLVED: To measure the wavelength and physical quantity of light reflected by a diffraction grating with high accuracy. SOLUTION: Pulse light having a designated wavelength obtained by modulating output light of a wide band light source 1 by an external modulator 2 enters from one end of an optical fiber having a diffraction grating FBG in the midway of an optical path, reflected light returned from the diffraction grating FBG to one end of the optical fiber is received through a wavelength inclined type optical filter 5 having a designated wavelength transmission characteristic by a photo detector 6, and the light intensity of the reflected light is measured to obtain the wavelength of reflected light from the light intensity of the reflected light.
机译:解决的问题:高精度测量衍射光栅反射的光的波长和物理量。解决方案:通过外部调制器2调制宽带光源1的输出光而获得的具有指定波长的脉冲光在光路中途从具有衍射光栅FBG的光纤的一端进入,到光纤的一端的衍射光栅FBG被光检测器6通过具有指定的波长透射特性的波长倾斜型滤光器5接收,并测量反射光的光强度以获得反射光的波长来自反射光的光强度。

著录项

  • 公开/公告号JP2002267537A

    专利类型

  • 公开/公告日2002-09-18

    原文格式PDF

  • 申请/专利权人 HITACHI CABLE LTD;

    申请/专利号JP20010068220

  • 发明设计人 FUKUCHI KEISUKE;

    申请日2001-03-12

  • 分类号G01J9/00;G01J3/18;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:00:20

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