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Inspection manner null of implemental being completed

机译:检查方式为实施完毕

摘要

PURPOSE: To inspect a board even when mounted parts are at a blind spot of a reflecting light in an apparatus which inspects a surface shape of the board by scanning the mounted printed board with fine beams and receiving the reflecting light, of fine beams by a photoelectric converting element. ;CONSTITUTION: Fine beams from a light source 1 are deflected by a polygon mirror 3 to scan over a substrate 7. A reflecting light from an irradiated position is received by four photoelectric converting elements 12, 13, 14, 15. Although one of the photoelectric converting elements enters a blind spot in the vicinity of a mounted part, it is distinguished from a difference of luminance, namely, a difference of the detecting amount of light, thereby to inspect the substrate.;COPYRIGHT: (C)1995,JPO
机译:目的:即使在安装部件位于反射光的盲点的情况下,也要通过检查细小光束扫描已安装的印刷电路板并用细光束接收细小光束的反射光的方法来检查电路板光电转换元件。 ;组成:来自光源1的细光束被多角镜3偏转,以在基板7上扫描。来自照射位置的反射光被四个光电转换元件12、13、14、15接收。光电转换元件进入安装部分附近的盲点,区别于亮度的差异,即光的检测量的差异,从而检查基板。版权所有:(C)1995,JPO

著录项

  • 公开/公告号JP3232811B2

    专利类型

  • 公开/公告日2001-11-26

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP19930249025

  • 发明设计人 木村 知博;

    申请日1993-10-05

  • 分类号G01B11/24;G01N21/88;G01N21/956;H05K13/08;

  • 国家 JP

  • 入库时间 2022-08-22 00:57:54

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