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METHOD AND APPARATUS FOR ANALYSIS OF TRACE IMPURITY IN GAS

机译:气体中痕量杂质分析的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a method and an apparatus, for the analysis of trace impurities in a gas, wherein the concentration of the trace impurities in the sample gas, especially the concentration of a nonmethane organic compound, can be quantitatively determined simply and with high sensitivity and also the concentration of carbon monoxide in nitrogen can be quantitatively determined.;SOLUTION: In a state that a component whose ironization potential is between methane and an organic compound, to be measured, (nonmethane organic compound) other than the methane exists in the sample gas, a drift voltage which is applied to electrodes at both ends of a differential pumping part is controlled. Carbon ions at an atomic level are dissociated from the nonmethane organic compound. On the basis of the ionic strength of the carbon ions, the nonmethane organic compound is quantitatively determined.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种用于分析气体中痕量杂质的方法和装置,其中可以简单,定量地测定样品气体中痕量杂质的浓度,尤其是非甲烷有机化合物的浓度。解决方案:在铁化电位介于甲烷和待测有机化合物(非甲烷有机化合物)之间的状态下,可以定量测定氮中一氧化碳的浓度。在样气中存在的情况下,控制施加到差动泵部分两端的电极上的漂移电压。原子级的碳离子与非甲烷有机化合物解离。根据碳离子的离子强度,定量测定非甲烷有机化合物。;版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002122570A

    专利类型

  • 公开/公告日2002-04-26

    原文格式PDF

  • 申请/专利权人 NIPPON SANSO CORP;

    申请/专利号JP20000314032

  • 申请日2000-10-13

  • 分类号G01N27/62;H01J49/10;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:23

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