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NONDESTRUCTIVE MEASURING METHOD AND DEVICE FOR COMPLEX DIELECTRIC CONSTANT

机译:复介电常数的无损测量方法及装置

摘要

PROBLEM TO BE SOLVED: To nondestructively measure the complex dielectric constant of a loss dielectric in microwave and milli-wave regions with a simple device.;SOLUTION: The dielectric of a measurement object is inserted into a dielectric interpolation section 2 formed with a flanged waveguide fitted with a flange on the opening section of the waveguide, the dielectric is pressed by two flanged waveguides, and the reflection coefficient of one opening face and the transmission coefficient of the other opening face are measured by a reflection/ transmission characteristics measuring device 1. The absolute values of the measured reflection coefficient and transmission coefficient and phase angles are substituted in simultaneous equations derived by solving Maxwell equation to calculate the dielectric constant of the dielectric. Since the reflection coefficient and the transmission coefficient in this structure correspond to the dielectric constant by one-to-one, the complex dielectric constant can be easily obtained by utilizing this relationship.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:用一个简单的设备无损地测量微波和毫米波区域中损耗电介质的复介电常数。解决方案:将测量对象的电介质插入由法兰式波导形成的电介质内插部分2中在波导管的开口部分上装有法兰的电介质被两个带法兰的波导管压紧,一个开口面的反射系数和另一个开口面的透射系数由反射/透射特性测量装置1测量。将测得的反射系数,透射系数和相角的绝对值代入通过求解麦克斯韦方程式导出的联立方程式中,以计算介电常数。由于该结构中的反射系数和透射系数与介电常数一一对应,因此利用该关系可以很容易地获得复数介电常数。;版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002214161A

    专利类型

  • 公开/公告日2002-07-31

    原文格式PDF

  • 申请/专利权人 TECH RES & DEV INST OF JAPAN DEF AGENCY;

    申请/专利号JP20010009468

  • 发明设计人 HIRANO MAKOTO;

    申请日2001-01-17

  • 分类号G01N22/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:03

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