首页> 外国专利> METHOD OF EVALUATING ALIGNMENT BETWEEN X-RAY SOURCE AND SCATTERED RAY REMOVING GRID, AND FEEDBACK METHOD, FEEDBACK DEVICE, X-RAY RADIOGRAPHY AND X-RAY RADIOGRAPHIC DEVICE

METHOD OF EVALUATING ALIGNMENT BETWEEN X-RAY SOURCE AND SCATTERED RAY REMOVING GRID, AND FEEDBACK METHOD, FEEDBACK DEVICE, X-RAY RADIOGRAPHY AND X-RAY RADIOGRAPHIC DEVICE

机译:X射线源与散射射线去除栅格之间的对准性评估方法,反馈方法,反馈设备,X射线放射线照相和X射线放射线照相设备

摘要

PROBLEM TO BE SOLVED: To eliminating the need for a hardware and evaluate the accuracy of alignment even if an obstacle exists between a grid cassette and a X-ray source.;SOLUTION: This alignment evaluating method for evaluating the accuracy of alignment between the X-ray source and a scattered X-ray removing grid comprises a radiography step (S1) of radiographing a X-ray image, a computation step (S2) of computing the contrast of the scattered X-ray removing grid for every region on the radiographed X-ray image, and evaluation steps (S3, S4) of analyzing the profile of the computed contrast and evaluating the accuracy of alignment between the X-ray source and the scattered X-ray removing grid.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:即使在栅格盒和X射线源之间存在障碍,也无需硬件并评估对准的准确性。解决方案:此对准评估方法用于评估X射线之间的对准准确性射线源和散射X射线去除栅格包括对X射线图像进行射线照相的射线照相步骤(S1),对射线照相的每个区域计算散射X射线去除栅格的对比度的计算步骤(S2) X射线图像,以及评估计算出的对比度的轮廓并评估X射线源与散射X射线去除栅格之间对准精度的评估步骤(S3,S4)。版权:(C)2001,日本特许厅

著录项

  • 公开/公告号JP2001346795A

    专利类型

  • 公开/公告日2001-12-18

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20000170707

  • 发明设计人 LAWRENCE CORT;

    申请日2000-06-07

  • 分类号A61B6/08;A61B6/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:58

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