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HEATING TEST DEVICE OF THIN FILM MAGNETIC HEAD AND HEATING TEST METHOD THEREOF

机译:薄膜磁头的加热试验装置及其加热试验方法

摘要

PROBLEM TO BE SOLVED: To heat only a thin film magnetic head till a set temperature with high precision without bringing a heating means into contact with the thin film magnetic head and in a short time.;SOLUTION: A heating test device of the thin film magnetic head is provided with an arm section 3 for fixing the thin film magnetic head 1 being a testing object, an input device 22 for setting a test temperature Ta of the thin film magnetic head 1, a laser source 4 for emitting laser beams, a focusing member 4a for focusing laser beams from the laser source 4 and emitting the beams to the thin film magnetic head 1, a resistance measuring apparatus 7 for measuring resistance value of the thin film magnetic head 1 and a comparing judging section 20 which compares resistance values of the thin film magnetic head 1 before and after irradiation with the laser beams and has a judging function for performing normal/defective condition decision.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:在不使加热装置在短时间内与薄膜磁头接触的情况下,仅以高精度将薄膜磁头加热至设定温度,解决方案:解决方案:薄膜的加热测试装置磁头设置有用于固定作为检查对象的薄膜磁头1的臂部3,用于设定薄膜磁头1的测试温度Ta的输入装置22,用于发射激光束的激光源4,用于聚焦来自激光源4的激光束并将其发射到薄膜磁头1的聚焦部件4a,用于测量薄膜磁头1的电阻值的电阻测量设备7以及用于比较电阻值的比较判断部分20薄膜磁头1的激光束照射前后的状态,并具有执行正常/不良状态判断的判断功能。;版权:(C)2002,JPO

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