首页> 外国专利> METHOD FOR MEASURING THICKNESS OF INTER-METALLIC COMPOUND USING EPMA METHOD, AND METHOD FOR MEASURING SOLID SHAPE OF INTER-METALLIC COMPOUND USING THE SAME

METHOD FOR MEASURING THICKNESS OF INTER-METALLIC COMPOUND USING EPMA METHOD, AND METHOD FOR MEASURING SOLID SHAPE OF INTER-METALLIC COMPOUND USING THE SAME

机译:用EPMA法测量金属间化合物厚度的方法,以及使用同一方法测量金属间化合物的固体形状的方法

摘要

PROBLEM TO BE SOLVED: To define correspondence between inter-metallic compounds and defects by measuring and estimating the thickness and solid shape of the inter-metallic compounds, in addition to distinguishing them and measuring their plane sizes.;SOLUTION: In the method of measuring the thickness and solid shape of the inter- metallic compound containing a plurality of constituent metals by EPMA, one point of measurement or a plurality of points of measurement on the inter-metallic compound are irradiated with an electron beam. Characteristic X-ray intensity excited by the irradiation with the electron beam at each point of measurement from the metal to be measured is measured. The relative X-ray intensity ratio of the metal to be measured at each point of measurement is computed from the measured characteristic X-ray intensity. From the relative X-ray intensity ratio of the metal to be measured at each point of measurement and the relationship between the relative X-ray intensity ratio of the metal to be measured and thickness obtained by the Monte Carlo simulation method, the thickness of the metal to be measured at each point of measurement is obtained or from the distribution of the points of measurement and the thickness at each point of measurement, the solid shape of the inter-metallic compound is measured by this method.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:除了区分它们并测量其平面尺寸外,还通过测量和估计金属间化合物的厚度和实心形状来定义金属间化合物与缺陷之间的对应关系;解决方案:在测量方法中用电子束照射通过EPMA对包含多种构成金属的金属间化合物的厚度和固体形状,金属间化合物上的一个测量点或多个测量点进行照射。测量在每个测量点由电子束照射而从待测金属激发的特征X射线强度。根据测量的特征X射线强度计算在每个测量点处待测量金属的相对X射线强度比。根据每个测量点的待测金属的相对X射线强度比以及要测量的金属的相对X射线强度比与通过蒙特卡罗模拟方法获得的厚度之间的关系,可以得出获得每个测量点的待测金属或从测量点的分布和每个测量点的厚度获得金属间化合物的固态形状。;版权:(C) 2002年

著录项

  • 公开/公告号JP2002189005A

    专利类型

  • 公开/公告日2002-07-05

    原文格式PDF

  • 申请/专利权人 NIPPON LIGHT METAL CO LTD;

    申请/专利号JP20010306759

  • 发明设计人 OSADA YOSHIO;

    申请日2001-10-02

  • 分类号G01N23/225;G01B15/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:06

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