首页> 外国专利> MEASURING METHOD OF CHROMATICITY OR ILLUMINANCE, AND MEASURING SYSTEM OF CHROMATICITY OR ILLUMINANCE

MEASURING METHOD OF CHROMATICITY OR ILLUMINANCE, AND MEASURING SYSTEM OF CHROMATICITY OR ILLUMINANCE

机译:色度或照度的测量方法以及色度或照度的测量系统

摘要

PROBLEM TO BE SOLVED: To provide a measuring system of chromaticity or illuminance capable of measuring highly accurately, when measuring the chromaticity or the illuminance of a beam emitted from a light source by using a colorimeter.;SOLUTION: This measuring system of chromaticity or illuminance for measuring the chromaticity or the illuminance of the beam emitted from the light source 100 is equipped with the colorimeter 10 for measuring the chromaticity or the illuminance of the beam emitted from the light source, and correction means 33, 34 for correcting a measured value of the colorimeter 10 based on a calibration value of the colorimeter 10 set corresponding to the wavelength of the beam measured by the colorimeter 10. As the calibration value corresponding to the wavelength of the beam at the measurement time by the colorimeter 10 can be used, the measured value can be corrected highly accurately.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种色度或照度的测量系统,当使用色度计测量从光源发射的光束的色度或照度时,能够高度精确地进行测量;解决方案:此色度或照度的测量系统用于测量从光源100发射的光束的色度或照度的用于测量从光源100发射的光束的色度或照度的比色计10,用于校正从光源100发射的光束的色度或照度的校正装置33、34。基于比色计10的校准值设置的比色计10,该比色仪10的校准值对应于由比色计10测量的光束的波长。作为与色度仪10在测量时的光束的波长相对应的校准值,可以使用测量值可以高精度地校正。;版权所有:(C)2001,日本特许厅

著录项

  • 公开/公告号JP2001324386A

    专利类型

  • 公开/公告日2001-11-22

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20000141715

  • 发明设计人 YAMAGISHI HIDEKAZU;AOYANAGI FUMIO;

    申请日2000-05-15

  • 分类号G01J3/50;G01J3/46;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:30

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