首页> 外国专利> SQUARENESS MEASURING INSTRUMENT, SQUARENESS MEASURING METHOD, SQUARENESS MEASURING PROGRAM, AND COMPUTER- READABLE STORAGE MEDIUM FOR STORING THE SAME PROGRAM

SQUARENESS MEASURING INSTRUMENT, SQUARENESS MEASURING METHOD, SQUARENESS MEASURING PROGRAM, AND COMPUTER- READABLE STORAGE MEDIUM FOR STORING THE SAME PROGRAM

机译:平方测量仪器,平方测量方法,平方测量程序以及用于存储同一程序的计算机可读存储介质

摘要

PROBLEM TO BE SOLVED: To highly accurately measure the squareness of apex angles in the case of an array-like tested object having a plurality of right-angled apex angle parts.;SOLUTION: Laser beam generated by a laser beam source 11 is transmitted by an objective lens 12 of a microscope and then converted into parallel light by a collimator lens 14. The parallel light is branched into reference light reflected by a transmission-type referential planar plate 17 and irradiation light to the tested object 20. Reflected light reflected by a surface of the object 20 after the irradiation thereof is transmitted by the plate 17 and returns along the same optical path. The reference light reflected by the plane 17 and body light reflected from the object 20 are turned into convergent light by the collimator lens 14, and it is perpendicularly branched out by an optical path branching means 13 to come into an interference fringe detection means 15. A detected interference fringe is analyzed by an arithmetic processing means 16, thereby obtaining the result of shape measurement of a planar surface.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:在具有多个直角顶角部分的阵列状被测物的情况下,为了高精度地测量顶角的直角度;解决方案:由激光束源11产生的激光束被透射。显微镜的物镜12,然后通过准直透镜14将其转换为平行光。平行光被分支为透射型参考平板17反射的参考光和照射到被检体20的反射光。照射后的物体20的表面被板17透射并沿着相同的光路返回。由平面17反射的参考光和从物体20反射的身体光被准直透镜14转换成会聚光,并且由光路分支装置13垂直地分支出来,进入干涉条纹检测装置15。通过算术处理装置16分析检测到的干涉条纹,从而获得平面形状的测量结果。COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002296007A

    专利类型

  • 公开/公告日2002-10-09

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20010098474

  • 发明设计人 TAKAI MASAAKI;

    申请日2001-03-30

  • 分类号G01B9/02;G01B11/26;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:28

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