首页> 外国专利> METHOD FOR MEASURING Ti COATING MASS OF TITANIUM-BASED CHEMICAL CONVERSION COATING FORMED ON SURFACE TREATED STEEL PLATE

METHOD FOR MEASURING Ti COATING MASS OF TITANIUM-BASED CHEMICAL CONVERSION COATING FORMED ON SURFACE TREATED STEEL PLATE

机译:表面处理钢板上钛基化学转化膜Ti涂层质量的测量方法

摘要

PROBLEM TO BE SOLVED: To accurately measure a Ti coating mass by offsetting effects of a Ti content and a plating mass of a substrate steel plate when the Ti coating mass is to be measured by X-ray fluorescence analysis of a titanium-based chemical conversion coating formed on a surface of a surface treated steel plate. SOLUTION: When the Ti coating mass is to be measured on the basis of a fluorescent X-ray intensity by exposing to X rays a sample to be measured of the surface treated steel plate having the titanium-based chemical conversion coating formed, constants IBG, A, a, h0, and constants B and b dependent on the Ti content of the substrate steel plate are preliminarily determined and the Ti fluorescent X-ray intensity obtained from the sample to be measured is substituted in the equation (1) of IP=IB+hS wherein (2) IB=IBG+A.Cexp(-aW), (3) h=h0+Bexp(-bW), C is the Ti content of the substrate steel plate and W is the plating mass. The Ti coating mass S is thus calculated.
机译:解决的问题:当通过基于钛的化学转化的X射线荧光分析来测量Ti涂层质量时,通过抵消Ti含量和基底钢板的镀层质量的影响来精确地测量Ti涂层质量在表面处理过的钢板表面上形成的涂层。 SOLUTION:当要通过荧光X射线强度测量Ti涂层质量时,将X射线暴露在已形成钛基化学转化膜的表面处理钢板的待测样品上,常数IBG,预先确定A,a,h0,以及取决于基底钢板的Ti含量的常数B和b,并将由待测样品获得的Ti荧光X射线强度代入IP = IB + hS其中,(2)IB = IBG + A.Cexp(-aW),(3)h = h0 + Bexp(-bW),C为基材钢板的Ti含量,W为镀覆质量。由此计算出Ti涂层质量S。

著录项

  • 公开/公告号JP2001337056A

    专利类型

  • 公开/公告日2001-12-07

    原文格式PDF

  • 申请/专利权人 NISSHIN STEEL CO LTD;

    申请/专利号JP20000158369

  • 发明设计人 YOSHIZAKI FUKIO;ANDO ATSUSHI;

    申请日2000-05-29

  • 分类号G01N23/223;C23C22/40;G01N33/20;

  • 国家 JP

  • 入库时间 2022-08-22 00:53:19

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