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Method and system for quantifying the integrity of an on-chip power supply network

机译:用于量化片上电源网络的完整性的方法和系统

摘要

A method and system for analyzing the dynamic behavior of an electrical circuit to determine whether a voltage level provided by a power supply network drops below a predetermined voltage level during operation of the electrical circuit is described. In a first step, a design data set representing pertinent technical specifications of an electrical or an integrated circuit are read in order to extract location information and value of switching and non-switching capacitance. Next, the circuit and technology propagation speeds are inputted therein. The length for specifying the size of a portion of a circuit area is determined wherein the electrical circuit is formed. Next, the circuit area is divided into a plurality of partitions of a specified size, and the switching capacitance and the non-switching capacitance are separately summarized for each partition. The voltage level drop is then calculated for each partition. Finally, the calculated voltage level drop is displayed in relation to the respective partition. The present method and system can be advantageously used for an on-chip power supply network evaluation as well as for an early chip development process.
机译:描述了一种用于分析电路的动态行为以确定在电路的操作期间由电源网络提供的电压电平是否下降到预定电压电平以下的方法和系统。第一步,读取表示电气或集成电路相关技术规格的设计数据集,以提取位置信息以及开关电容和非开关电容的值。接下来,在其中输入电路和技术的传播速度。确定用于指定电路区域的一部分的大小的长度,其中形成电路。接下来,将电路区域划分为指定大小的多个分区,并且针对每个分区分别总结开关电容和非开关电容。然后计算每个分区的电压降。最后,相对于各个分区显示计算出的电压水平下降。本方法和系统可以有利地用于片上电源网络评估以及早期的芯片开发过程。

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