A differential interference contrast (DIC) microscope system is provided comprising: (a) an illumination source for illuminating a sample ; (b) a lens system for viewing the illuminated sample, including an objective, defining an optical axis; (c) at least one detector system for receiving a sample image; (d) mechanisms for wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the resultant DIC images on the detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, wavelength multiplexed DIC images to differ in either or both shear direction or magnitude. These approaches include (1) two DIC microscopes, each operating at a different wavelength, but which share a single objective through a beam splitter; (2) a segmented DIC prism that is made in four sections where opposite sections are paired and have the same shear direction and amount, and each pair of sections have filters transmitting different wavelengths; (3) a segmented DIC prism that is located in or near an aperture stop or pupil of said DIC microscope to obtain data in two shear directions that is multiplexed by wavelength; (4) a dual field-of-view optical system with two DIC prisms, one in each path to wavelength multiplex shear direction or shear magnitude through said objective; (5) demultiplexing wavelength multiplexed DIC images through the use of a wavelength selective beam splitter and two detectors; (6) demultiplexing wavelength multiplexed DIC images through the use of a wavelength controlled source and a single detector; and (7) demultiplexing wavelength multiplexed DIC images through the use of dual field-of-view optics and a single detector. These various approaches permit rapid, robust measurement of slope in two directions. Further, phase shifting and DIC microscopy are limited to measurements within the depth of focus (DOF) of the objective while WLI microscopy is not.
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