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METHOD AND APPARATUS FOR ADAPTIVELY LEARNING TEST MEASUREMENT DELAYS ON AN INDIVIDUAL DEVICE TEST FOR REDUCING TOTAL DEVICE TEST TIME
METHOD AND APPARATUS FOR ADAPTIVELY LEARNING TEST MEASUREMENT DELAYS ON AN INDIVIDUAL DEVICE TEST FOR REDUCING TOTAL DEVICE TEST TIME
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机译:自适应学习单个设备测试中的测试测量延迟以减少设备总测试时间的方法和装置
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摘要
An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.
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