首页> 外国专利> Planar shape characteristic measuring apparatus and planar shape characteristic measuring method

Planar shape characteristic measuring apparatus and planar shape characteristic measuring method

机译:平面形状特性测定装置及平面形状特性测定方法

摘要

A planar shape characteristic measuring apparatus, and a planar shape characteristic measuring method, which can precisely and efficiently measure the characteristics relating to a surface shape of the measured surface of a disk such as a data recording surface of an optical disk including a laser Doppler speed meter which detects a perpendicular direction speed of a measured surface of a rotating disk; a tilt angle calculating unit which calculates a tilt angle in the rotational direction of an optical disk at each measuring position to a reference surface based on a linear speed at each measuring position detected by the laser Doppler speed meter and the detected perpendicular direction speed; a displacement calculating unit which calculates a perpendicular direction displacement of the optical disk at each measuring position; an acceleration calculating unit which calculates a perpendicular direction acceleration; and a tracking error calculating unit which calculates a tracking error which is predicted to occur in a focus servo system.
机译:平面形状特征测量装置和平面形状特征测量方法,其可以精确和有效地测量与诸如激光多普勒速度的光盘的被测量表面(例如光盘的数据记录表面)的表面形状有关的特征。检测旋转盘的被测表面的垂直方向速度的仪表;倾斜角计算单元,其基于由激光多普勒测速仪检测到的每个测量位置处的线速度和检测到的垂直方向速度,来计算在每个测量位置处的光盘旋转方向上相对于基准面的倾斜角;位移计算单元,计算在每个测量位置的光盘的垂直方向位移;加速度计算单元,计算垂直方向的加速度;跟踪误差计算单元,其计算预测在聚焦伺服系统中发生的跟踪误差。

著录项

  • 公开/公告号US2002034151A1

    专利类型

  • 公开/公告日2002-03-21

    原文格式PDF

  • 申请/专利权人 NAKAJIMA TOSHIHIRO;

    申请/专利号US20010860498

  • 发明设计人 TOSHIHIRO NAKAJIMA;

    申请日2001-05-21

  • 分类号G11B17/04;G11B17/08;

  • 国家 US

  • 入库时间 2022-08-22 00:52:16

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号