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ENHANCED GRADING AND SORTING OF SEMICONDUCTOR DEVICES USING MODULAR 'PLUG-IN' SORT ALGORITHMS
ENHANCED GRADING AND SORTING OF SEMICONDUCTOR DEVICES USING MODULAR 'PLUG-IN' SORT ALGORITHMS
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机译:使用模块化“插入式”排序算法来增强半导体设备的分级和排序
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摘要
A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.
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