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Surface texture measuring instrument, surface texture measuring method and stylus radius measuring instrument

机译:表面纹理测量仪,表面纹理测量方法和测针半径测量仪

摘要

A Stylus 1 is moved along the surface of a workpiece 20 and the surface texture of the workpiece 20 is measured based on the displacement of the stylus 1 in the Z direction. A spherical reference gage of known radius is measured with the stylus 1 in advance and radius values r of the tip sphere of the stylus 1 are calculated according to angle by subtracting the radius R of the reference gage from the measured values. The actual contour of workpiece 20 is calculated by using the radius values r as the correction data according to angle and subtracting the correction values according to angle and subtracting the correction values according to angle from the measured data obtained by movement along the surface of workpiece 20.
机译:沿工件 20 的表面移动触控笔 1 ,并根据触控笔的位移测量工件 20 的表面纹理 1 沿Z方向。预先使用测针 1 测量已知半径的球形参考量规,并通过减去半径来根据角度计算测针 1 的尖端球面的半径值r由测量值得出的参考量具的R。工件 20 的实际轮廓是通过将半径值r作为根据角度的校正数据,然后从根据以下方法获得的测量数据中减去根据角度的校正值,然后根据根据角度减去校正值而计算出的沿工件 20的表面运动。

著录项

  • 公开/公告号US6453730B2

    专利类型

  • 公开/公告日2002-09-24

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORPORATION;

    申请/专利号US20010805935

  • 发明设计人 ISAMU TAKEMURA;

    申请日2001-03-15

  • 分类号G01B52/80;G01B52/00;

  • 国家 US

  • 入库时间 2022-08-22 00:48:30

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