首页> 外国专利> Temperature stable integrated circuit full wave level detector incorporating a single operational amplifier stage design

Temperature stable integrated circuit full wave level detector incorporating a single operational amplifier stage design

机译:具有单个运算放大器级设计的温度稳定集成电路全波电平检测器

摘要

A temperature stable, integrated circuit full wave level detector incorporating a single stage operational amplifier design which does not require, as in prior art implementations, two operational amplifiers to perform a full wave rectification function on an input alternating current (“AC”) signal followed by a comparator to detect the resultant signal level. The full wave level detector of the present invention utilizes but a single amplifier and some additional peripheral components resulting in a saving in on-chip die area in an integrated circuit (“IC”) implementation while also exhibiting excellent temperature stability characteristics.
机译:一种温度稳定的集成电路全波电平检测器,该检测器结合了单级运算放大器设计,该设计不需要像现有技术中的实施方式那样的两个运算放大器来对输入的交流电(“ AC”)信号执行全波整流功能随后是一个比较器,以检测结果信号电平。本发明的全波电平检测器仅利用单个放大器和一些附加的外围组件,从而节省了集成电路(“ IC”)实现中的片上管芯面积,同时还表现出出色的温度稳定性。

著录项

  • 公开/公告号US6456058B1

    专利类型

  • 公开/公告日2002-09-24

    原文格式PDF

  • 申请/专利权人 SHENZHEN STS MICROELECTRONICS CO. LTD.;

    申请/专利号US20000643157

  • 发明设计人 GANG ZHA;

    申请日2000-08-21

  • 分类号G01R116/30;G01R192/20;H03K110/00;

  • 国家 US

  • 入库时间 2022-08-22 00:48:10

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