首页> 外国专利> Semiconductor structures using a group III-nitride quaternary material system with reduced phase separation and method of fabrication

Semiconductor structures using a group III-nitride quaternary material system with reduced phase separation and method of fabrication

机译:使用具有减小的相分离的III族氮化物四元材料系统的半导体结构及其制造方法

摘要

Group III-nitride quaternary and pentenary material systems and methods are disclosed for use in semiconductor structures, including laser diodes, transistors, and photodetectors, which reduces or eliminates phase separation and provides increased emission efficiency. In an exemplary embodiment the semiconductor structure includes a first ternary, quaternary or pentenary material layer using an InGaAlNP layer of a first conduction type formed substantially without phase separation, a quaternary or pentenary material active layer using an InGaAlNP active layer substantially without phase separation, and a third ternary, quaternary or pentenary InGaAlNP material layer of an opposite conduction type formed substantially without phase separation.
机译:公开了用于包括激光二极管,晶体管和光电检测器的半导体结构中的III族氮化物四元和五元材料系统和方法,其减少或消除了相分离并提供了增加的发射效率。在示例性实施例中,半导体结构包括使用基本没有相分离形成的第一导电类型的InGaAlNP层的第一三元,四元或五边材料层,使用基本没有相分离的InGaAlNP有源层的四元或五边材料有源层以及形成基本上没有相分离的相反导电类型的第三三元,四元或五元InGaAlNP材料层。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号