首页> 外国专利> Multi-beam scanning method, apparatus and multi-beam light source device achieving improved scanning line pitch using large light emitting points interval

Multi-beam scanning method, apparatus and multi-beam light source device achieving improved scanning line pitch using large light emitting points interval

机译:使用大的发光点间隔实现改善的扫描线间距的多光束扫描方法,装置和多光束光源装置

摘要

A multi-beam scanning method for scanning a scanning surface with a plurality of beams which are formed into a plurality of beam spots separated from each other in a sub scanning direction includes providing n number of semiconductor laser array units, each of the n number of semiconductor laser array units having m number of light emitting points, where n is not equal to 1 and m is not equal to 1, coupling light beams emitted from the light emitting points of the semiconductor laser arrays, synthesizing the coupled beams with a beam synthesizing device to obtain m×n number of beams and deflecting the m×n number of beams at substantially the same time such that the deflected beams are impinged on the scanning surface.
机译:一种用于用形成在副扫描方向上彼此分离的多个光束斑的多个光束扫描扫描表面的多光束扫描方法,包括提供n个半导体激光器阵列单元,n个半导体激光器阵列单元中的每个具有m个发光点的半导体激光器阵列单元,其中n不等于1并且m不等于1,耦合从半导体激光器阵列的发光点发射的光束,利用光束合成来合成耦合光束该装置获得m×n个光束并且使m×n个光束基本上同时偏转,以使偏转的光束撞击在扫描表面上。

著录项

  • 公开/公告号US6366384B1

    专利类型

  • 公开/公告日2002-04-02

    原文格式PDF

  • 申请/专利权人 RICOH COMPANY LTD.;

    申请/专利号US19990333209

  • 发明设计人 KOHJI SAKAI;MAGANE AOKI;

    申请日1999-06-15

  • 分类号G02B260/80;

  • 国家 US

  • 入库时间 2022-08-22 00:47:41

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