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Fluorescent x-ray analyzer including detection signal correction based on position variation

机译:荧光X射线分析仪,包括基于位置变化的检测信号校正

摘要

A fluorescent x-ray analyzer has a sample table with a movable part such as a turret which can be moved such that a sample which is placed at a specified sample position thereon can be moved to a specified position for analysis, an x-ray source for emitting primary x-rays, a detector for detecting secondary x-rays emitted from the irradiated sample, and a correcting device for correcting the detection signal outputted from the detector for an error caused by the variation in the sample position, or the variations in the distance between the plane of measurement and the x-ray source and/or the detector.
机译:荧光X射线分析仪具有样品台,该样品台具有可移动的部件,例如转塔,该部件可以移动,使得放置在其上的指定样品位置的样品可以移动到指定位置以进行分析;用于发射初级X射线的检测器,用于检测从被照射样品发射的次级X射线的检测器,以及用于校正从检测器输出的检测信号的校正装置,该校正信号是由于样品位置的变化或样品的变化引起的误差。测量平面与X射线源和/或检测器之间的距离。

著录项

  • 公开/公告号US6324251B1

    专利类型

  • 公开/公告日2001-11-27

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号US19990464585

  • 发明设计人 SHOJI KUWABARA;

    申请日1999-12-16

  • 分类号G01N232/23;

  • 国家 US

  • 入库时间 2022-08-22 00:47:11

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