首页> 外国专利> Electron microscope with an energy filter having hexapole correctors which are coupled with a projective system downstream of the energy filter

Electron microscope with an energy filter having hexapole correctors which are coupled with a projective system downstream of the energy filter

机译:具有带六极校正器的能量过滤器的电子显微镜,该六极校正器与能量过滤器下游的投影系统耦合

摘要

The invention is directed to an electron microscope having a magnetic energy filter. The energy filter has four deflection regions and seven hexapole correctors for correcting the aberrations of the energy filter. A projection system is mounted downstream of the filter. With the projection system, the achromatic image plane is selectively imaged onto the CCD camera for energy-filtered object imaging or the dispersion plane is imaged on a CCD camera for spectrum detection. For an object registration, the hexapoles are so excited that all geometric aberrations of the second order are corrected in the achromatic image plane and in the dispersion plane. For the spectrum imaging, the excitation of three hexapoles is so changed that the axial chromatic aberration of the filter is corrected while maintaining the correction of the spherical aberration in the achromatic image plane and while maintaining the correction of all geometric errors of the second order in the dispersion plane.
机译:本发明涉及具有磁能过滤器的电子显微镜。能量过滤器具有四个偏转区域和七个用于校正能量过滤器像差的六极校正器。投影系统安装在滤镜的下游。使用投影系统,消色差图像平面选择性地成像到CCD相机上以进行能量过滤的对象成像,或者色散平面成像在CCD相机上以进行光谱检测。对于物体配准,六极杆是如此兴奋,以至于在消色差像平面和色散平面中校正了所有二阶几何像差。对于光谱成像,改变三个六极杆的激励,以便在保持消色差图像平面中的球面像差的校正并同时保持所有二阶几何误差的校正的同时校正滤镜的轴向色差。分散平面。

著录项

  • 公开/公告号US6384412B1

    专利类型

  • 公开/公告日2002-05-07

    原文格式PDF

  • 申请/专利权人 LEO ELEKTRONENMIKROSKOPIE GMBH;

    申请/专利号US19990339822

  • 发明设计人 DIETER KRAHL;STEPHAN KUJAWA;

    申请日1999-06-25

  • 分类号H01J494/60;

  • 国家 US

  • 入库时间 2022-08-22 00:46:50

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