首页> 外国专利> Low column leakage nor flash array-double cell implementation

Low column leakage nor flash array-double cell implementation

机译:低柱泄漏或闪速阵列-双电池实施

摘要

The present invention relates to a flash memory array architecture, comprising a plurality of bit lines, wherein each of the bit lines comprise a plurality of memory cells associated therewith. The plurality of memory cells are configured as sets of two series-connected memory cells, wherein two sets of such memory cells are coupled together in parallel between a respective bit line and an individually selectable source line. In addition, the flash memory array architecture comprises a plurality of word lines, wherein each of the plurality of memory cells associated with one of the plurality of bits lines is coupled to a respective one of the plurality of word lines. The present invention further comprises a method of reading flash memory cells associated with such an architecture.
机译:本发明涉及一种闪存阵列结构,包括多条位线,其中每条位线包括与其相关联的多个存储单元。多个存储单元被配置为两组串联连接的存储单元,其中两组这样的存储单元在各自的位线和可单独选择的源极线之间并联耦合在一起。另外,闪存阵列架构包括多条字线,其中与多条位线之一相关联的多个存储单元中的每一个都耦合到多条字线中的相应一条。本发明进一步包括一种读取与这种架构相关联的闪存单元的方法。

著录项

  • 公开/公告号US6449188B1

    专利类型

  • 公开/公告日2002-09-10

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC.;

    申请/专利号US20010884565

  • 发明设计人 RICHARD FASTOW;

    申请日2001-06-19

  • 分类号G11C160/00;

  • 国家 US

  • 入库时间 2022-08-22 00:46:46

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号