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Spectrometer calibration method, comprises measuring signal strength for pixels when light is absent and present at different wavelength and intensity
Spectrometer calibration method, comprises measuring signal strength for pixels when light is absent and present at different wavelength and intensity
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机译:光谱仪校准方法,包括在不存在光并且以不同波长和强度存在时测量像素的信号强度
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摘要
The calibration method involves measuring zero signal strength for each pixel in the absence of light and then measuring the signal strength for each pixel with different light intensities or for a chosen number of pixels with a standard light source emitting at one or more single wavelengths. The signal strength for each pixel is processed to establish the associated standard zero level, gain and position relative to the beam component, resulting in a uniformly calibrated spectrometer. The beam of light is composed of light with different wavelengths. The spectrometer comprises a light beam input part, a lattice, a light beam orienting part, a CCD array with rows of pixels comprising a semiconductor material, and an electric switch for processing the electric signals generated in the array.
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