首页> 外国专利> Spectrometer calibration method, comprises measuring signal strength for pixels when light is absent and present at different wavelength and intensity

Spectrometer calibration method, comprises measuring signal strength for pixels when light is absent and present at different wavelength and intensity

机译:光谱仪校准方法,包括在不存在光并且以不同波长和强度存在时测量像素的信号强度

摘要

The calibration method involves measuring zero signal strength for each pixel in the absence of light and then measuring the signal strength for each pixel with different light intensities or for a chosen number of pixels with a standard light source emitting at one or more single wavelengths. The signal strength for each pixel is processed to establish the associated standard zero level, gain and position relative to the beam component, resulting in a uniformly calibrated spectrometer. The beam of light is composed of light with different wavelengths. The spectrometer comprises a light beam input part, a lattice, a light beam orienting part, a CCD array with rows of pixels comprising a semiconductor material, and an electric switch for processing the electric signals generated in the array.
机译:校准方法包括在不存在光的情况下为每个像素测量零信号强度,然后在具有一个或多个单一波长的标准光源下测量具有不同光强度的每个像素或选定数量的像素的信号强度。对每个像素的信号强度进行处理,以建立相关的标准零电平,相对于光束分量的增益和位置,从而得到统一校准的光谱仪。光束由具有不同波长的光组成。该光谱仪包括光束输入部分,点阵,光束定向部分,具有包括半导体材料的像素行的CCD阵列以及用于处理在阵列中产生的电信号的电开关。

著录项

  • 公开/公告号NL1019975C1

    专利类型

  • 公开/公告日2002-08-20

    原文格式PDF

  • 申请/专利权人 FPS FOOD PROCESSING SYSTEMS B.V.;

    申请/专利号NL20021019975

  • 发明设计人 LEO CREZEE;

    申请日2002-02-15

  • 分类号G01J3/28;

  • 国家 NL

  • 入库时间 2022-08-22 00:44:21

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