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MONOLITHIC TEMPERATURE COMPENSATION SCHEME FOR FIELD EFFECT TRANSISTOR INTEGRATED CIRCUITS

机译:场效应晶体管集成电路的单相温度补偿方案

摘要

A method and apparatus of substantially canceling the effects of temperature on the electrical performance of Field Effect Transistor (FET) integrated circuits (IC's) by exploiting a subtle feature of an epitaxial resistor implemented in an FET process. Specifically, the invention takes advantage of two constituent epitaxial resistor components having resistances that vary monotonically in opposite directions as functions of temperature. The essential components include: a plurality of ohmic contacts (100), and an isolated semi-conductor channel (102) residing in a layered semiconductor. The resistance of the epitaxial resistor iR/i of the invention is comprised of an aggregate of resistances (FIG. 1c). The invention includes a method for selecting the geometry of such an epitaxial resistor to give it either temperature invariance or a specific, useful functional temperature dependence.
机译:一种通过利用在FET工艺中实现的外延电阻器的微妙特征来基本消除温度对场效应晶体管(FET)集成电路(IC)的电性能的影响的方法和设备。特别地,本发明利用两个组成的外延电阻器组件,其具有随温度而沿相反方向单调变化的电阻。基本组件包括:多个欧姆接触(100),以及位于分层半导体中的隔离半导体通道(102)。本发明的外延电阻器的电阻由电阻的总和构成(图1c)。本发明包括一种选择这种外延电阻器的几何形状以使其具有温度不变性或特定的,有用的功能温度依赖性的方法。

著录项

  • 公开/公告号WO0175982A3

    专利类型

  • 公开/公告日2002-04-04

    原文格式PDF

  • 申请/专利权人 HRL LABORATORIES LLC;

    申请/专利号WO2001US01625

  • 发明设计人 MATLOUBIAN MEHRAN M.;POBANZ CARL W.;

    申请日2001-01-18

  • 分类号H01L29/8605;G01K7/00;

  • 国家 WO

  • 入库时间 2022-08-22 00:38:24

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