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A METHOD FOR PROGRAMMING A SINGLE EPROM OR FLASH MEMORY CELL TO STORE MULTIPLE LEVELS OF DATA THAT UTILIZES A FORWARD-BIASED SOURCE-TO-SUBSTRATE JUNCTION
A METHOD FOR PROGRAMMING A SINGLE EPROM OR FLASH MEMORY CELL TO STORE MULTIPLE LEVELS OF DATA THAT UTILIZES A FORWARD-BIASED SOURCE-TO-SUBSTRATE JUNCTION
Multiple logic levels can be programmed into a single EPROM or FLASH memory cell by applying one of a corresponding number of programming voltages to the control gate of a memory cell that has a forward-biased source-to-substrate junction and a reverse-biased drain-to-substrate junction. During programming, the bias conditions form substrate hot electrons which, in addition to the channel hot electrons, accumulate on the floating gate. By utilizing the substrate hot electrons, a much lower control gate voltage can be utilized during programming. More importantly, however, once the channel hot electrons cease to exist, the substrate hot electrons and holes converge to a stable charge that is related to the control gate voltage used during programming and the programmed threshold voltage of the cell.
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