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Non-contact thickness gauge for non-metallic materials in the form of film, foil, tape and the like

机译:用于膜,箔,带等形式的非金属材料的非接触式测厚仪

摘要

The invention relates to a thickness gauge (1) for non metallic materials (4) in the form of foil, film, tape or the like which comprisesfirst non contact measuring means (3), designed to measure the distance of the faced material surface, and second non contact measuring means (5), designed to measure the distance of a metal reference surface (6), said first and second measuring means (3, 5) being installed on one side of a space for receiving the material (4) and operating in two coaxial spatial regions, so that their measurements refer to a same measuring axis (8), wherein the first non contact measuring means (3) is a backscattering fluid sensor.
机译:本发明涉及用于箔,膜,带等形式的非金属材料(4)的厚度计(1),其包括:第一非接触式测量装置(3),用于测量饰面材料表面的距离;第二非接触式测量装置(5),用于测量金属基准面(6)的距离,所述第一和第二测量装置(3、5)安装在用于容纳物料(4)的空间的一侧并在两个同轴的空间区域中操作,以使它们的测量指向同一测量轴(8),其中第一非接触式测量装置( 3)是反向散射流体传感器。

著录项

  • 公开/公告号EP0811826B1

    专利类型

  • 公开/公告日2002-08-14

    原文格式PDF

  • 申请/专利权人 ELECTRONIC SYSTEMS SPA;

    申请/专利号EP19970104086

  • 发明设计人 MASOTTI ALESSANDRO;

    申请日1997-03-11

  • 分类号G01B13/06;G01B7/06;

  • 国家 EP

  • 入库时间 2022-08-22 00:36:10

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