According to an embodiment of the present invention, a contact portion in contact with a terminal of a material to be tested is disposed to penetrate the first insulation portion in a thickness direction within the first insulation portion, and the contact portion is formed between the first insulation portion and the second insulation portion. A structure in which the first conductive wiring is connected to a first conductive circuit board having a structure connected to a first conductive wiring, and a second conductive wiring connected to an electrical tester for testing electrical characteristics of the sample. And a second conductive circuit board having a coefficient of thermal expansion equal to or similar to the thermal expansion coefficient of the sample, wherein the leads of the first conductive circuit board are heat such as single point bonding, gang bonding, or the like. The present invention relates to a searcher electrically connected to the second conductive circuit board by adhesion, solder reflowing, or the like.
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