首页> 外国专利> METHOD FOR ALIGNING TWO OBJECTS METHOD FOR DETECTING SUPERIMPOSING STATE OF TWO OBJECTS AND APPARATUS FOR ALIGNING TWO OBJECTS

METHOD FOR ALIGNING TWO OBJECTS METHOD FOR DETECTING SUPERIMPOSING STATE OF TWO OBJECTS AND APPARATUS FOR ALIGNING TWO OBJECTS

机译:用于对两个对象进行叠加的方法用于检测两个对象的叠加状态的方法以及用于对两个对象进行叠加的设备

摘要

PURPOSE: To solve the problem that a complicated computing and processing operation must be performed in each object probe and each object pad when a plurality of object probes 8A and their corresponding object pads are aligned. CONSTITUTION: In the alignment method, an object probe 8B and an object pad P are imaged respectively by an upper CCD camera 7A and a lower CCD camera 7B. A probe-tip image 8B and a pad image P are formed in respective image regions on a monitor screen 9A. A gray level due to the brightness is applied to pixels which form the probe-tip image 8B and the pad image P. The probe-tip image 8B is moved to the monitor screen 9A so as to be overlapped with the pad image P. The sum total of brightnesses of all the pixels constituting the pad image is calculated. A position which becomes darkest is judged to be the position in which the object probes 8A are brought most favorably into contact with the object pads.
机译:用途:为了解决当多个物体探测器8A和它们对应的物体垫对准时,必须在每个物体探测器和每个物体垫中执行复杂的计算和处理操作的问题。构成:在对准方法中,物体探测器8B和物体垫P分别由上CCD照相机7A和下CCD照相机7B成像。在监视器屏幕9A上的各个图像区域中形成探针图像8B和焊盘图像P。由于亮度而产生的灰度级被施加到形成探针尖端图像8B和焊盘图像P的像素。探针尖端图像8B移动到监视器屏幕9A,以与焊盘图像P重叠。计算构成焊盘图像的所有像素的亮度总和。将最暗的位置判断为最有利于使物体探针8A与物体垫接触的位置。

著录项

  • 公开/公告号KR20020036732A

    专利类型

  • 公开/公告日2002-05-16

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号KR20010069418

  • 发明设计人 OBI HIROKI;

    申请日2001-11-08

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-22 00:31:03

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