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Method of Confirming Progress in Semi-conductor Assembly Process using Moisture Color Changing Compound

机译:用水分变色化合物确认半导体组装工艺进展的方法

摘要

PURPOSE: A method of confirming progress in semiconductor assembly process using moisture color changing compound is provided to ascertain whether a die attach curing process, a plasma cleaning process or a post curing process are passed or not, and an indicating mark using the wetness indicator is provided for a PCB, a magazine and a tray. CONSTITUTION: The wetness indicator(11) uses a moisture color changing compound such as cobalt chloride contained in a transparent or translucent element such as silica gel. The color change compound becomes altered in color according to relative moisture. The indicating mark of a base material(12) such as the PCB, the magazine and the tray includes a plurality of grooves, which are filled with the wetness indicator(11) and have different depths. Since the wetness indicator(11) alters in color from a surface adjoining the air, the degree of color change informs progressing time of heat treatment or plasma treatment.
机译:目的:提供一种使用水分变色化合物确认半导体组装工艺进展的方法,以确定是否通过了管芯附着固化工艺,等离子清洁工艺或后固化工艺,并且使用湿度指示器的指示标记为提供用于PCB,杂志和托盘。组成:湿度指示器(11)使用一种变色化合物,例如透明或半透明元素(如硅胶)中所含的氯化钴。变色化合物根据相对湿度而变色。诸如PCB,盒和托盘之类的基础材料(12)的指示标记包括多个凹槽,这些凹槽被湿度指示器(11)填充并且具有不同的深度。由于湿度指示器(11)从与空气相邻的表面改变颜色,所以颜色变化的程度通知了热处理或等离子体处理的进行时间。

著录项

  • 公开/公告号KR20020072609A

    专利类型

  • 公开/公告日2002-09-18

    原文格式PDF

  • 申请/专利权人 COSEP. INC;

    申请/专利号KR20010012517

  • 发明设计人 LEE BYEONG CHEOL;

    申请日2001-03-12

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-22 00:30:23

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