Semiconductor memory device including chip selection circuit and method for generating chip selection signal

摘要

PURPOSE: A semiconductor memory device having a chip selection circuit and a method for generating a chip selection signal are provided to analyze a cause of a bad semiconductor memory device and improve the quality of the semiconductor memory device by selecting only a selected particular memory device such as a bad memory device. CONSTITUTION: An address register(11) receives an address(ADD) from an outside of a semiconductor memory device and outputs the received address to a programming register(13). A timing register(12) receives a command(CMD) from an outside of a semiconductor memory device and outputs the received command to the programming register(13). The programming register(13) activates its own output signal(MRSi) in response to the address of the address register(11) and the command of the timing register(12). An input buffer control circuit(14) activates its own output signal(Buff_on) and data input buffer circuits(15_0 to 15_n) in response to activation of the output signal(MRSi) of the programming register(13). A chip selection circuit(16) activates a chip selection signal(CMSS) and an error verification and improvement circuit(17) when one or more output signals(Output_0 to Output_n) of the data input buffers(15_0 to 15_n) are in a state of the first logic. The error verification and improvement circuit(17) are formed by a repair circuit or a test time reduction circuit.